The X-ray diffractometer has various forms and uses, but its basic structure is very similar. It is the basic schematic diagram of the X-ray diffractometer, and the main components include four parts.

(1) A high stability X-ray source provides the required X-rays for measurement. Changing the anode target material of the X-ray tube can change the wavelength of the X-rays, and adjusting the anode voltage can control the intensity of the X-ray source.

(2) The adjustment mechanism system for sample and sample position orientation. The sample must be a solid block of single crystal, powder, polycrystalline or microcrystalline.

(3) X-ray detectors detect diffraction intensity or simultaneously detect diffraction direction, and polycrystalline diffraction pattern data can be obtained through instrument measurement and recording systems or computer processing systems.

(4) The processing and analysis system for diffraction patterns. Modern X-ray diffractometers come with computer systems equipped with specialized diffraction pattern processing and analysis software, which are characterized by automation and intelligence.