TESCAN MAGNA

Excellent resolution and performance at low voltage, particularly suitable for nano characterization

TESCAN MAGNAIt is an extremely powerful analytical instrument that can be used to characterize the surface of nanomaterials and perform microscopic analysis.TESCAN MAGNAUsing Triglav ™ Type SEM lens tube, with ultra-high resolution, particularly noticeable under low voltage; The detector system inside the mirror tube has the ability to filter electronic signals, which can achieve better image contrast and surface sensitivity. In addition,TESCAN MAGNAEquipped with a Schottky field emission electron gun, capable of providing a beam current of up to 400 nA, while Triglav ™ The excellent performance and high stability of the SEM tube provide the best conditions for the analysis of micro analysis and time-consuming samples.

TESCAN MAGNAThe excellent performance under low voltage and the various image contrasts that can be obtained make it very suitable for imaging non-conductive samples, such as ceramics, uncoated biological samples, and photosensitive samples that are increasingly used in the semiconductor industry and new material research.TESCAN MAGNAUsing the brand new TESCAN Essence ™ The software has a user-friendly interface that can meet various application needs, customizable layouts, and automated sample preparation functions, maximizing operational convenience and work efficiency.

main features

The best solution for characterizing nanomaterials
Triglav of TESCAN patent ™ The SEM lens tube has a TriLens system with three objectives ™ ， Compared to similar devices, it has more diverse functions. The ultra-high resolution provided by UH resolution objective is very suitable for observing morphological details, allowing researchers to better analyze nanoscale samples. The new high-resolution Analytical objective enables leak free magnetic imaging, making it an ideal choice for observing and analyzing magnetic samples (EDS, EBSD). The third objective can achieve multiple modes of observation and optimize the beam spot shape, thereby improving imaging and analysis performance.
Can obtain images with different contrasts, providing maximum insight into the sample
TESCAN Magna equipped with TriBE ™ Detector system: includes three backscattered electron detectors that can selectively collect signals based on differences in angle and energy. Mid Angle BSE and In Beam f-BSE detectors are located inside the mirror tube and can receive medium anglesThe backscattered electrons in the axial direction are detected, while the backscattered electron detector in the sample chamber is used to receive wide-angle backscattered electrons. Meanwhile, MAGNA is also equipped with TriSE ™ Detector system: There are three secondary electron detectors that can obtain secondary electrons in the best way in all working modes. In Beam SE detectors can receive secondary electrons at very short working distances; SE (BDM) can provide the best resolution for secondary electron detectors in electron beam deceleration mode; The secondary electron detector inside the sample room can provide the best morphology contrast image.
More excellent imaging capabilities
The new generation Triglav ™ The detector system inside the mirror tube has been further optimized, and the signal detection efficiency has increased by more than three times. In addition, the system has expanded its detection capability to collect axial backscattered electron signals after energy filtering, allowing for better contrast and surface sensitivity by selectively collecting low loss backscattered electrons.

Provide the best analysis conditions
The new generation Triglav ™ The mirror tube also has an adaptive beam spot optimization function, which can improve the resolution under high beam current, which is conducive to better analysis of EDS, WDS, EBSD, and other factors. In addition, the Schottky field emission electron gun can generate an electron beam current of up to 400 nA, and the voltage can be quickly changed to ensure good signal acquisition in all analytical applications.
Make complex applications unprecedentedly simple
New generation TESCAN Essence ™ It is a simplified, multi-user software with a layout manager that helps users quickly and conveniently access all major features. The software interface can be customized to best adapt to specific application directions and meet the preferences of different users. The various functional modules, guides, and application solutions of the software enable both entry-level and expert level users to easily and smoothly master the operation of scanning electron microscopy, thereby improving sample processing speed and work efficiency.

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