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The Thermo Scientific K-Alpha X-ray photoelectron spectroscopy (XPS) system has brought a new method for surface analysis. The K-Alpha XPS system focuses on using simplified workflows to provide high-quality results, making XPS operations simple and intuitive without sacrificing performance or functionality.
The most advanced performance, lower price, easier usability, and larger sample testing volume make the K-Alpha XPS system an ideal choice for multi-user environments. The K-Alpha XPS system enables researchers from around the world to conduct surface analysis.
Online lecture: Thermo Scientific K-Alpha XPS system
The X-ray monochromator allows for selection in the analysis area of 50 µ m to 400 µ m with a step size of 5 µ m to seek the desired signal maximization.
Efficient electronic lenses, hemispherical analyzers, and detectors can achieve excellent detection and rapid data collection.
Using the patented optical observation system of K-Alpha XPS and XPS SnapMap to focus samples, we help you quickly determine the analysis and testing area.
The patented dual beam electron source couples low-energy ion beams with low-energy electrons (less than 1 eV) to prevent sample charging during the analysis process, thus eliminating the charging effect in most cases.
Use EX06 ion source for deeper surface analysis. The automatic source optimization and gas processing functions ensure excellent performance and experimental reproducibility.
The intuitive operation guided by the Avantage data system makes the K-Alpha XPS system an ideal choice for multi-user, testing center, and XPS experts who focus on efficient operation and high testing volume.
Provide optional various special sample stages for variable angle XPS, sample bias testing, or inert transfer of samples from glove boxes.
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