The ARL QUANT'X EDXRF spectrometer provides ultimate performance, versatility, and reliability for elemental analysis.
Compact desktop design, tightly coupled optical components, and advanced electronic cooling detectors,
Enable us to achieve unparalleled analytical accuracy over a wide dynamic range from ppm to percentage element concentration.
The functionality of ARL QUANT'X EDXRF has become even more powerful! QUANT'X has installed a newer generation of SDD detectors,
Capable of handling high counting rates with excellent solutions, with excellent performance in analyzing elements from light to heavy on the periodic table.
ARL QUANT'X has better sensitivity to elements in the periodic table, effectively increasing precision and detection limit by 2 times.
In addition, the average counting time can be reduced to a quarter of the original, significantly increasing the sample processing volume!
The SDD500G detector has equipped the ARL QUANT'X spectrometer with cutting-edge detection technology and further improved performance.
SDD500G can significantly improve the sensitivity of light elements such as fluorine and extend its analysis range to carbon.
Advanced technology
High performance SDD500 silicon drift detector, covering fluorine to americium
Optional: Latest generation SDD500G detector, covering carbon to americium
Advanced Digital Pulse Processing (DPP) technology
High performance, multi-element analysis
Optional Thermo Scientific ™ UniQuant ™ The software can provide excellent standard free analysis
main features
Excellent trace analysis sensitivity
High measurement flux, suitable for process control
Advanced atypical material analysis algorithms
Excellent sample processing flexibility
Mechanical simplicity and reliability
Compact, small footprint, easy to transport, suitable for on-site measurement
Fast and simple installation, comprehensive on-site customization
Includes complete laboratory startup package
Can perform sample analysis in air, vacuum, and helium
Verified hardware and integrated software
On site collaborative method development
Comprehensive technical application support
Professional knowledge of hundreds of applications
Large sample room, camera, and various range collimators
Powerful and easy-to-use Thermo Scientific ™ WinTrace ™ software
Standard free and semi standard free analysis.
Basic parameters (FP) and empirical methods including standard products
Multi layer thickness and composition
Unrestricted elements, unlimited quantity of standard products
Simply transfer the results to an external computer or LIMS
Supports nine languages. Support for more languages
Multiple triggering conditions, automated operation
Optional UniQuant Advanced Standard Free Sample Analysis
Further than any other FP analysis, the selected UniQuant program collects all spectral lines emitted by all possible elements from fluorine to americium (carbon to americium, optional SDD500G). This complete sample spectral curve enables UniQuant to automatically correct for all possible overlaps and background effects that are particularly complex in energy dispersive spectra
Always able to analyze all elements
Include the unique physical properties (i.e. area, thickness, and mass) of each sample in the calculation
Correction of long-term changes in X-ray tube output
Multiple optional report levels and formats can clearly present results to any type of user
UniQuant undergoes comprehensive pre calibration at the factory and is a ready to use model
Suggested for solving
The problems you encounter in forensic science and trace element analysis
Jewelry and precious metal analysis
RoHS/WEEE screening of heavy metals in plastics
Petroleum industry products
Plastics and polymers
Environmental applications
Waste mud and waste oil
Nutritional supplements in food and feed
Soil pollution and other environmental screening
Corrosion monitoring of cooling water circuits
Cement, kiln feed and alternative fuels
Metallurgical slag and ore mining
Catalysts and Chemicals
Film on filter, coating on metal
Aerosol particle filters for air pollution monitoring